Products – Real-Time Signal Probing Systems

High-speed, real-time internal probing system
Measurement bandwidth can be up to 40 GHz
Probing spatial resolutions down to < 8 µm
Minimal invasiveness to the device under test
Three different types of probes (EO, MO, and Voltage) can be used interchangeably
Capable of monitoring high-speed, time-varying signals
Suitable for high-speed digital, modulated RF, or mixed signal applications

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